Supplément au Journal de Physique Colloques

OXIDE DEGRADATION AND BREAKDOWN IN STRESSED MOS CAPACITORS

I. PLACENCIA, J. SUÑÉ, N. BARNIOL, E. FARRÉS and X. AYMERICH

J. Phys. Colloques, 49 C4 (1988) C4-783-C4-786

DOI: 10.1051/jphyscol:19884164

I. PLACENCIA

J. SUÑÉ

N. BARNIOL

E. FARRÉS

X. AYMERICH

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