Supplément au Journal de Physique Colloques

DEGRADATION OF SHORT-CHANNEL MOS TRANSISTORS STRESSED AT LOW TEMPERATURE

C. NGUYEN-DUC, S. CRISTOLOVEANU, G. REIMBOLD and J. GAUTIER

J. Phys. Colloques, 49 C4 (1988) C4-661-C4-664

DOI: 10.1051/jphyscol:19884138

C. NGUYEN-DUC

S. CRISTOLOVEANU

G. REIMBOLD

J. GAUTIER

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