Supplément au Journal de Physique Colloques

NON-DESTRUCTIVE CHARACTERISATION OF DEVICE PROCESSING OF SILICON-ON-SAPPHIRE (SOS) WAFERS

C. PICKERING, S. SHARMA, S. COLLINS, A.G. MORPETH, G.R. TERRY and A.M. HODGE

J. Phys. Colloques, 49 C4 (1988) C4-55-C4-58

DOI: 10.1051/jphyscol:1988410

C. PICKERING

S. SHARMA

S. COLLINS

A.G. MORPETH

G.R. TERRY

A.M. HODGE

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