Supplément au Journal de Physique Colloques

CHARACTERISATION OF NANOMETER-SCALE EPITAXIAL STRUCTURES BY GRAZING-INCIDENCE X-RAY SCATTERING

T.W. RYAN, C. LUCAS, P.D. HATTON and S. BATES

J. Phys. Colloques, 48 C5 (1987) C5-109-C5-111

DOI: 10.1051/jphyscol:1987519

T.W. RYAN

C. LUCAS

P.D. HATTON

S. BATES

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