Supplément au Journal de Physique Colloques

ELECTRON MICROSCOPICAL STUDY OF OXYGEN RELATED DEFECTS IN CZOCHRALSKI SILICON

H. Bender, C. Claeys, J. Van Landuyt, G. Declerck, S. Amelinckx and R. Van Overstraeten

J. Phys. Colloques, 44 C4 (1983) C4-261-C4-265

DOI: 10.1051/jphyscol:1983431

H. Bender

C. Claeys

J. Van Landuyt

G. Declerck

S. Amelinckx

R. Van Overstraeten

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