Supplément au Journal de Physique Colloques

CHARACTERIZATION OF DIELECTRIC FILMS ON SEMICONDUCTOR SUBSTRATES BY LEAKY-MODES MEASUREMENT

J.-P. Gruson, P.-J. Goirand, F. Cochet and O. Parriaux

J. Phys. Colloques, 44 C10 (1983) C10-131-C10-134

DOI: 10.1051/jphyscol:19831028

J.-P. Gruson

P.-J. Goirand

F. Cochet

O. Parriaux

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