TEM AND EBIC INVESTIGATIONS OF POLYCRYSTALLINE SILICON SHEETS GROWN BY THE RAD GROWTH PROCESS R. Sharko, A. Gervais et C. Texier-Hervo J. Phys. Colloques, 43 C1 (1982) C1-129-C1-133 DOI: 10.1051/jphyscol:1982118