A MEASUREMENT OF A SURFACE SELF-DIFFUSION COEFFICIENT BY SCANNING TUNNELING MICROSCOPY M. DRECHSLER, B. L. BLACKFORD, A. M. PUTNAM et M. H. JERICHOJ. Phys. Colloques, 50 C8 (1989) C8-223-C8-228DOI: https://doi.org/10.1051/jphyscol:1989838
