GLANCING INCIDENCE X-RAY STUDIES OF TITANIUM NITRIDE THIN FILMS USING A NEW MULTIPURPOSE LABORATORY SPECTROMETER R.C BUSCHERT, P. N. GIBSON, W. GISSLER, J. HAUPT et T. A. CRABBJ. Phys. Colloques, 50 C7 (1989) C7-169-C7-173DOI: https://doi.org/10.1051/jphyscol:1989716
