OBSERVATION OF GETTERING PHENOMENA AT DEFECTS IN GaAs BY SIMULTANEOUS EBIC/CL MEASUREMENTS M. ECKSTEIN, A. JAKUBOWICZ, M. BODE et H.-U. HABERMEIERJ. Phys. Colloques, 50 C6 (1989) C6-180DOI: https://doi.org/10.1051/jphyscol:1989634
