LIGHT BEAM INDUCED CURRENT IMAGING OF THE ELECTRICAL ACTIVITY OF STACKING FAULTS IN CZ SILICON A. CASTALDINI, A. CAVALLINI, A. POGGI et E. SUSIJ. Phys. Colloques, 50 C6 (1989) C6-169DOI: https://doi.org/10.1051/jphyscol:1989626
