MINORITY-CARRIER DIFFUSION LENGTH : MEASUREMENTS BY EBIC, CONNECTION TO MATERIALS MICROSTRUCTURE AND RELATION TO DEVICE PERFORMANCE M. KITTLER et W. SEIFERTJ. Phys. Colloques, 50 C6 (1989) C6-31-C6-46DOI: https://doi.org/10.1051/jphyscol:1989603
