AES, XPS AND TEM CHARACTERIZATION OF BORON NITRIDE DEPOSITED UNDER CHEMICAL VAPOR INFILTRATION (CVI) CONDITIONS O. DUGNE, S. PROUHET, A. GUETTE, R. NASLAIN, R. FOURMEAUX, K. HSSEIN, J. SEVELY, C. GUIMON, D. GONBEAU et G. PFISTER-GUILLOUZOJ. Phys. Colloques, 50 C5 (1989) C5-333-C5-341DOI: https://doi.org/10.1051/jphyscol:1989540
