ATOM-PROBE FIELD-ION MICROSCOPY OF HIGH-TEMPERATURE SUPERCONDUCTING MATERIALS G. ZAHARCHUK, L.v. ALVENSLEBEN, M. OEHRING et P. HAASENJ. Phys. Colloques, 49 C6 (1988) C6-471-C6-476DOI: https://doi.org/10.1051/jphyscol:1988680
