PROGRESS IN FIELD ION MICROSCOPY IMAGING OF HIGH-Tc SUPERCONDUCTING OXIDES A. J. MELMED, R. D. SHULL et C. K. CHIANGJ. Phys. Colloques, 49 C6 (1988) C6-459-C6-464DOI: https://doi.org/10.1051/jphyscol:1988678
