STRAIN-INDUCED BOUNDARY MIGRATION (SIBM) IN ALUMINUM BICRYSTALS EACH WITH A <211> TILT BOUNDARY F. INOKO et M. KOBAYASHIJ. Phys. Colloques, 49 C5 (1988) C5-605-C5-610DOI: https://doi.org/10.1051/jphyscol:1988576
