INTERFACE STATES PARAMETERS DEDUCED FROM DLTS, ICTS AND CONDUCTANCE METHODS ON TiAu/Si3N4/GaInAs MIS STRUCTURES J. BARRIER, M. RENAUD, P. BOHER et J. SCHNEIDERJ. Phys. Colloques, 49 C4 (1988) C4-227-C4-230DOI: https://doi.org/10.1051/jphyscol:1988447
