NUMERICAL SIMULATIONS TO IMPROVE THE ACCURACY OF ELECTRON-BEAM TESTING ON PASSIVATED INTEGRATED CIRCUITS H. FREMONT, A. TOUBOUL, D. GOBLED et Y. DANTOJ. Phys. Colloques, 49 C4 (1988) C4-149-C4-152DOI: https://doi.org/10.1051/jphyscol:1988429
