A MICROWAVE METHOD FOR CONTACTLESS MEASUREMENT OF THE LIFETIME OF FREE CARRIERS IN SILICON WAFERS T. OTAREDIAN, S. MIDDELHOEK et M. J.J. THEUNISSENJ. Phys. Colloques, 49 C4 (1988) C4-145-C4-148DOI: https://doi.org/10.1051/jphyscol:1988428
