SOME ASPECTS OF THE SCANNING ACOUSTIC MICROSCOPE CONTRIBUTIONS IN THE EVALUATION OF DEVICE RELIABILITY A. SAIED, C. AMAUDRIC DU CHAFFAUT, J. M. SAUREL et J. ATTALJ. Phys. Colloques, 49 C4 (1988) C4-801-C4-804DOI: https://doi.org/10.1051/jphyscol:19884168
