THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS P. T.J. BIERMANS, T. POORTER et H. J.H. MERKS-EPPINGBROEKJ. Phys. Colloques, 49 C4 (1988) C4-787-C4-790DOI: https://doi.org/10.1051/jphyscol:19884165
