INFLUENCE OF HYDROGEN RELATED DEFECTS ON THE Qot, Dit BUILD-UP DUE TO STRESS AND ANNEALING IN THE MOS SYSTEM F. WULF et D. BRÄUNIGJ. Phys. Colloques, 49 C4 (1988) C4-757-C4-760DOI: https://doi.org/10.1051/jphyscol:19884158
