TWO-DIMENSIONAL COMPUTER SIMULATION OF HOT CARRIER DEGRADATION IN N. MOSFETs M. GARRIGUES, A. ALEXANDRE, P. ROJO, T. PEDRON, K. BELHADDAD et A. PONCETJ. Phys. Colloques, 49 C4 (1988) C4-673-C4-676DOI: https://doi.org/10.1051/jphyscol:19884141
