INTERFACE STATE GENERATION IN NMOS TRANSISTORS DURING HOT CARRIER STRESS AT LOW TEMPERATURES D. KRISHNA RAO, M. M. HEYNS et R. F. DE KEERSMAECKERJ. Phys. Colloques, 49 C4 (1988) C4-669-C4-672DOI: https://doi.org/10.1051/jphyscol:19884140
