EFFECTS OF MECHANICAL STRESS ON MOS STRUCTURES WITH TiSi2 GATES P. J. REUTERS, J. GIESE, M. OFFENBERG, W. RICHTER, S. EWERT et P. BALKJ. Phys. Colloques, 49 C4 (1988) C4-45-C4-48DOI: https://doi.org/10.1051/jphyscol:1988408
