COMBINED FIELD ION AND SCANNING TUNNELING MICROSCOPE T. Sakurai, T. Hashizurne, I. Kamiya, Y. Hasegawa, A. Sakai, A. Kobayashi, J. Matsui, S. Takahashi, E. Kono et H. WatanabeJ. Phys. Colloques, 48 C6 (1987) C6-79-C6-84DOI: https://doi.org/10.1051/jphyscol:1987613
