DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE F. R. THORNLEY, G. M. ANTONINI, G. N. GREAVES et N. T. BARRETTJ. Phys. Colloques, 47 C8 (1986) C8-883-C8-886DOI: https://doi.org/10.1051/jphyscol:19868171
