THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY A. J. Melmed, M. E. Twigg, R. Klein, M. J. Kaufman et H. L. FraserJ. Phys. Colloques, 45 C9 (1984) C9-373-C9-378DOI: https://doi.org/10.1051/jphyscol:1984962
