MINORITY CARRIER LIFETIME MEASUREMENTS IN SEMICONDUCTOR DEVICES MONITORED BY A MICROPROCESSOR IN E.B.I.C, MODE J. F. Bresse et D. RivièreJ. Phys. Colloques, 45 C2 (1984) C2-865-C2-868DOI: https://doi.org/10.1051/jphyscol:19842198
