CHARACTERIZATION OF OXIDE FILMS ON Fe-Cr-Al ALLOYS AND RF-SPUTTERED FILMS BY SOFT X-RAY SPECTROSCOPY AND MICROANALYSIS S. MarunoJ. Phys. Colloques, 45 C2 (1984) C2-653-C2-656DOI: https://doi.org/10.1051/jphyscol:19842152
