MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY J. Sevely, Y. Kihn, G. Zanchi et B. JouffreyJ. Phys. Colloques, 45 C2 (1984) C2-441-C2-444DOI: https://doi.org/10.1051/jphyscol:19842100
