THICKNESS DETERMINATION OF Al FILMS ON Si BY A MONTE CARLO CODE INCLUDING A SECONDARY FLUORESCENCE CORRECTION A. Armigliato, A. Desalvo, A. Garulli et R. RosaJ. Phys. Colloques, 45 C2 (1984) C2-29-C2-32DOI: https://doi.org/10.1051/jphyscol:1984207
