PICOSECOND LASER ANNEALING OF IMPLANTED Si AND GaAs : A COMPARATIVE STUDY WITH A RAMAN MICROPROBE J. Sapriel, Y. I. Nissim et J. L. OudarJ. Phys. Colloques, 44 C5 (1983) C5-187-C5-191DOI: https://doi.org/10.1051/jphyscol:1983529
