STUDY OF SOME OPTICAL AND ELECTRICAL PROPERTIES OF HEAVILY DOPED SILICON LAYERS A. Slaoui, E. Fogarassy, J. C. Muller et P. SiffertJ. Phys. Colloques, 44 C5 (1983) C5-65-C5-71DOI: https://doi.org/10.1051/jphyscol:1983509
