DISLOCATION MOBILITY MEASUREMENTS : AN ESSENTIAL TOOL FOR UNDERSTANDING THE ATOMIC AND ELECTRONIC CORE STRUCTURES OF DISLOCATIONS I N SEMICONDUCTORS F. Louchet et A. GeorgeJ. Phys. Colloques, 44 C4 (1983) C4-51-C4-60DOI: https://doi.org/10.1051/jphyscol:1983406
