ELECTROREFLECTANCE OF THIN ZINC SULFIDE FILMS GROWN BY ATOMIC LAYER EPITAXY AND ELECTRON BEAM EVAPORATION TECHNIQUES J. A. Lahtinen et T. TuomiJ. Phys. Colloques, 44 C10 (1983) C10-239-C10-242DOI: https://doi.org/10.1051/jphyscol:19831050
