RAMAN SPECTROSCOPY CHARACTERIZATION OF POLYCRYSTALLINE GaP THIN FILMS GROWN BY MO-CVD PROCESS USING [Et2Ga - PEt2]3 AS ONLY SOURCE F. Maury, M. Combes, G. Constant, R. Carles et J. B. RenucciJ. Phys. Colloques, 43 C1 (1982) C1-347-C1-352DOI: https://doi.org/10.1051/jphyscol:1982146
