GRAIN-BOUNDARIES CURRENT-VOLTAGE CHARACTERISTICS ON Si (p) BICRYSTALS : MULTI-STEP RESONANCE TUNNELING CONDUCTION THROUGH TRAPS V. K. Truong, J. J. Marchand et H. NodetJ. Phys. Colloques, 43 C1 (1982) C1-165-C1-170DOI: https://doi.org/10.1051/jphyscol:1982123
