MINORITY CARRIER LIFETIME AND POTENTIAL BARRIER HEIGHT IN POLYCRYSTALLINE SILICON : EFFECTS OF LOW TEMPERATURE ANNEALINGS AND NEUTRON IRRADIATION D. Bielle-Daspet, M. Roux et J. FarahJ. Phys. Colloques, 43 C1 (1982) C1-95-C1-101DOI: https://doi.org/10.1051/jphyscol:1982114
