NUCLEAR SCATTERING MEASUREMENTS OF COMPOSITION PROFILES IN a-Si : H MULTILAYER STRUCTURES C. Brassard, R. Groleau, J. L'Ecuyer, J. P. Martin, J. F. Currie, P. Depelsenaire, M. Wertheimer et A. YelonJ. Phys. Colloques, 42 C4 (1981) C4-795-C4-798DOI: https://doi.org/10.1051/jphyscol:19814174
