ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY : ITS APPLICATION TO THE STUDY OF GAP STATES OF a-Si:H H. Okushi, Y. Tokumaru, S. Yamasaki, H. Oheda et K. TanakaJ. Phys. Colloques, 42 C4 (1981) C4-613-C4-616DOI: https://doi.org/10.1051/jphyscol:19814134
