MEASUREMENT OF ELECTRON DENSITY AND TEMPERATURE PROFILES BY MEANS OF MULTIPOSITION THOMSON SCATTERING D. Oepts, E. P. Barbian et P. J. BuschJ. Phys. Colloques, 40 C7 (1979) C7-793-C7-794DOI: https://doi.org/10.1051/jphyscol:19797382
