HIGH VOLTAGE ELECTRON MICROSCOPY AND SCANNING ELECTRON MICROSCOPY (EBIC MODE) OF THE SAME DISLOCATION J. Heydenreich, H. Blumtritt, R. Gleichmann et H. JohansenJ. Phys. Colloques, 40 C6 (1979) C6-23-C6-26DOI: https://doi.org/10.1051/jphyscol:1979605
