E.P.R. and susceptibility measurements in XAl2 (X = Sc, Y, La, Yb, Lu) compounds containing Gd, Er, Dy and Nd impurities R. Levin, A. Grayevsky, D. Shaltiel et V. ZevinJ. Phys. Colloques, 40 C5 (1979) C5-48-C5-50DOI: https://doi.org/10.1051/jphyscol:1979519
