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Article cité :

Revisiting Compositional Accuracy of Carbides Using a Decreased Detector Efficiency in a LEAP 6000 XR Atom Probe Instrument

Severin Jakob and Mattias Thuvander
Microscopy and Microanalysis 30 (6) 1163 (2025)
https://doi.org/10.1093/mam/ozae069

Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography

Baptiste Gault, Aparna Saksena, Xavier Sauvage, Paul Bagot, Leonardo S Aota, Jonas Arlt, Lisa T Belkacemi, Torben Boll, Yi-Sheng Chen, Luke Daly, Milos B Djukic, James O Douglas, Maria J Duarte, Peter J Felfer, Richard G Forbes, Jing Fu, Hazel M Gardner, Ryota Gemma, Stephan S A Gerstl, Yilun Gong, Guillaume Hachet, Severin Jakob, Benjamin M Jenkins, Megan E Jones, Heena Khanchandani, et al.
Microscopy and Microanalysis 30 (6) 1205 (2025)
https://doi.org/10.1093/mam/ozae081

Isotopic Correction of Compositional Inaccuracies in the Atom Probe Analysis of LaB6

S. Ndiaye, O. Bhorade, I. Blum, B. Klaes, C. Bacchi, J. Houard, A. Vella, F. Vurpillot and L. Rigutti
The Journal of Physical Chemistry C 128 (7) 2937 (2024)
https://doi.org/10.1021/acs.jpcc.3c07595

Atom probe tomography of hyper-doped Ge layers synthesized by Sb in-diffusion by pulsed laser melting

Samba Ndiaye, Sébastien Duguay, François Vurpillot, Chiara Carraro, Gianluigi Maggioni, Enrico Di Russo, Davide De Salvador, Enrico Napolitani and Lorenzo Rigutti
Materials Science in Semiconductor Processing 164 107641 (2023)
https://doi.org/10.1016/j.mssp.2023.107641

Quantification of dopant species using atom probe tomography for semiconductor application

Wai Kong Yeoh, Shih‐Wei Hung, Shih‐Che Chen, Yi‐Hsiang Lin and Jang Jung Lee
Surface and Interface Analysis 52 (5) 318 (2020)
https://doi.org/10.1002/sia.6706

Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach

C. Bacchi, G. Da Costa and F. Vurpillot
Microscopy and Microanalysis 25 (2) 418 (2019)
https://doi.org/10.1017/S143192761801629X

Improving Compositional Accuracy in APT Analysis of Carbides Using a Decreased Detection Efficiency

Mattias Thuvander, Deodatta Shinde, Arbab Rehan, Sebastian Ejnermark and Krystyna Stiller
Microscopy and Microanalysis 25 (2) 454 (2019)
https://doi.org/10.1017/S1431927619000424

Atom probe tomography field evaporation characteristics and compositional corrections of ZrB2

David L.J. Engberg, Lina Tengdelius, Hans Högberg, Mattias Thuvander and Lars Hultman
Materials Characterization 156 109871 (2019)
https://doi.org/10.1016/j.matchar.2019.109871

Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments

Tomas L. Martin, Andrew J. London, Benjamin Jenkins, et al.
Microscopy and Microanalysis 23 (2) 227 (2017)
https://doi.org/10.1017/S1431927617000356

Evaluation of Analysis Conditions for Laser-Pulsed Atom Probe Tomography: Example of Cemented Tungsten Carbide

Zirong Peng, Pyuck-Pa Choi, Baptiste Gault and Dierk Raabe
Microscopy and Microanalysis 23 (2) 431 (2017)
https://doi.org/10.1017/S1431927616012654

Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography

Frederick Meisenkothen, Eric B. Steel, Ty J. Prosa, Karen T. Henry and R. Prakash Kolli
Ultramicroscopy 159 101 (2015)
https://doi.org/10.1016/j.ultramic.2015.07.009