A NEW METHOD FOR THE EXTRACTION OF MOSFET PARAMETERS AT AMBIENT AND LIQUID HELIUM TEMPERATURES
J. Phys. Colloques, 49 C4 (1988) C4-817-C4-820
Article cité par
La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program. Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
Citations de cet article :
Modeling of β-Ga2O3 based double gate drain extended junction less FET and its parameter extraction methodology
Vanajakumari Raju Manukrishna and KrishnanNadar Savithry NikhilModelling and Simulation in Materials Science and Engineering 33 (2) 025012 (2025)
https://doi.org/10.1088/1361-651X/ada819
(2024)
https://doi.org/10.21203/rs.3.rs-5349438/v1
Silicon-processes-compatible contact engineering for two-dimensional materials integrated circuits
Li Gao, Zhangyi Chen, Chao Chen, Xiankun Zhang, Zheng Zhang and Yue ZhangNano Research 16 (11) 12471 (2023)
https://doi.org/10.1007/s12274-023-6167-z
Springer Handbook of Semiconductor Devices
Salim El Ghouli and Denis RideauSpringer Handbooks, Springer Handbook of Semiconductor Devices 391 (2023)
https://doi.org/10.1007/978-3-030-79827-7_12
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures
Hung-Chi Han, Farzan Jazaeri, Antonio D’Amico, et al.Solid-State Electronics 193 108296 (2022)
https://doi.org/10.1016/j.sse.2022.108296
Pronounced Optoelectronic Effect in n–n ReS2 Homostructure
Sewon Park, Jisang Ha, Muhammad Farooq Khan, et al.ACS Applied Electronic Materials 4 (9) 4306 (2022)
https://doi.org/10.1021/acsaelm.2c00567
Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range
Nguyen Cong Dao, Abdallah El Kass, Craig T. Jin and Philip H. W. LeongIEEE Electron Device Letters 38 (7) 847 (2017)
https://doi.org/10.1109/LED.2017.2709545
Contact Effect of ReS2/Metal Interface
Jae Young Park, Hang-Eun Joe, Hyong Seo Yoon, et al.ACS Applied Materials & Interfaces 9 (31) 26325 (2017)
https://doi.org/10.1021/acsami.7b06432