Articles citing this article

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Cited article:

Laser-induced sputtered neutral mass spectrometry study of arsenic concentration profiles in a polycrystalline silicon/single-crystal silicon system

Yasuhiro Higashi, Tetsuya Maruo, Yoshikazu Homma, Jun’ichi Kodate and Masayasu Miyake
Applied Physics Letters 64 (18) 2391 (1994)
https://doi.org/10.1063/1.111624

Thermal stability of polysilicon resistors

J.E. Suarez, B.E. Johnson and B. El-Kareh
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 15 (3) 386 (1992)
https://doi.org/10.1109/33.148507

Demonstration of the importance of the oxide breakup in polysilicon-contacted-emitter modeling

J.L. Egley and J.L. Gray
IEEE Transactions on Electron Devices 38 (9) 2112 (1991)
https://doi.org/10.1109/16.83737

Impact of copper contamination on the quality of silicon oxides

H. Wendt, H. Cerva, V. Lehmann and W. Pamler
Journal of Applied Physics 65 (6) 2402 (1989)
https://doi.org/10.1063/1.342808