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Cited article:

Impact of Impurities on Leakage Current Induced by High-Energy Density Pulsed Laser Annealing in Si Diodes

Richard Monflier, Richard Daubriac, Mahmoud Haned, Toshiyuki Tabata, François Olivier, Eric Imbernon, Markus Italia, Antonino La Magna, Fulvio Mazzamuto, Louis Thuries, Simona Boninelli, Fuccio Cristiano and Elena Bedel Pereira
IEEE Transactions on Electron Devices 72 (11) 5860 (2025)
https://doi.org/10.1109/TED.2025.3614566