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Cited article:

A new method for ellipsometric inversion with microcomputers: Characterization of optically absorbing films using multiple-angle-of-incidence

T. Easwarakhanthan, P. Mas, M. Renard and S. Ravelet
Surface Science 216 (1-2) 198 (1989)
https://doi.org/10.1016/0039-6028(89)90653-5