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Article cité :

Influence of the acceptance angle on the evaluation of reflectance data of randomly rough surfaces using scalar diffraction theory

Jiří Vohánka, Ivan Ohlídal and Petr Klapetek
Optik 317 172086 (2024)
https://doi.org/10.1016/j.ijleo.2024.172086

Optical characterization of inhomogeneous thin films with randomly rough boundaries

Jiří Vohánka, Ivan Ohlídal, Vilma Buršíková, Petr Klapetek and Nupinder Jeet Kaur
Optics Express 30 (2) 2033 (2022)
https://doi.org/10.1364/OE.447146

Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers

Ivan Ohlídal, Jiří Vohánka, Martin Čermák and Daniel Franta
Surface Topography: Metrology and Properties 7 (4) 045004 (2019)
https://doi.org/10.1088/2051-672X/ab359d

Comparative study of a standard optical steel plate surface using ellipsometry and speckle interferometry

Niveen Farid, Naglaa Mahmoud and Nabil Nagib
Journal of Optics 47 (3) 366 (2018)
https://doi.org/10.1007/s12596-018-0455-0

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

Ivan Ohlídal, Jiří Vohánka, Martin Čermák and Daniel Franta
Applied Surface Science 419 942 (2017)
https://doi.org/10.1016/j.apsusc.2017.04.211

Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies

Ivan Ohlídal, David Necas and Daniel Franta
physica status solidi c 5 (5) 1399 (2008)
https://doi.org/10.1002/pssc.200777769

Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films

Ivan Ohlídal and David Nečas
Journal of Modern Optics 55 (7) 1077 (2008)
https://doi.org/10.1080/09500340701618379

Influence of Surface Roughness on Radiation from Parabolic Mirror Collimators with Cylindrical Symmetry in the Fraunhofer Region

Ivan Ohlídal
Optica Acta: International Journal of Optics 32 (1) 27 (1985)
https://doi.org/10.1080/713821641

Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry

Ivan Ohlidal and Karel Navratil
Applied Optics 24 (16) 2690 (1985)
https://doi.org/10.1364/AO.24.002690

Photothermal displacement spectroscopy: An optical probe for solids and surfaces

M. A. Olmstead, N. M. Amer, S. Kohn, D. Fournier and A. C. Boccara
Applied Physics A Solids and Surfaces 32 (3) 141 (1983)
https://doi.org/10.1007/BF00616610

Chemistry and Physics of Solid Surfaces IV

G. A. Bootsma, L. J. Hanekamp and O. L. J. Gijzeman
Springer Series in Chemical Physics, Chemistry and Physics of Solid Surfaces IV 20 77 (1982)
https://doi.org/10.1007/978-3-642-47495-8_4

Expression for the reflectance of randomly rough surfaces derived with the Fresnel approximation

Ivan Ohlidal
Applied Optics 19 (11) 1804 (1980)
https://doi.org/10.1364/AO.19.001804

The optical analysis of non-absorbing thin films with randomly rough boundaries by means of immersion spectrophotometry

I. Ohlídal, K. Navrátil and F. Lukeš
Thin Solid Films 57 (1) 179 (1979)
https://doi.org/10.1016/0040-6090(79)90426-7